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Measurement of On-chip I/O Power Supply Noise and Correlation Verification between Noise Magnitude and Delay Increase due to SSO

机译：片上I / O电源噪声的测量以及噪声幅度与SSO引起的延迟增加之间的相关性验证

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Yasumichi Takai; Yasuhiro Ogasahara; Masanori Hashimoto; Takao Onoye;
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年度 2010
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1. Experimental Verification Of Power Supply Noise Modeling For Emi Analysis Through On-board And On-chip Noise Measurements [J] . Kouji ICHIKAWA, Yuki TAKAHASHI, Makoto NAGATA IEICE Transactions on Electronics . 2007,第6期

机译：通过板载和片内噪声测量进行Emi分析的电源噪声建模的实验验证
2. Validation of a Full-Chip Simulation Model for Supply Noise and Delay Dependence on Average Voltage Drop With On-Chip Delay Measurement [J] . Ogasahara Y., Enami T., Hashimoto M., IEEE transactions on circuits and systems. II, Express briefs . 2007,第10期

机译：利用片上延迟测量验证电源噪声和平均电压降相关延迟的全芯片仿真模型
3. Circuits and Techniques for High-Resolution Measurement of On-Chip Power Supply Noise [J] . Elad Alon, Vladimir Stojanovic, Mark A. Horowitz IEEE Journal of Solid-State Circuits . 2005,第4期

机译：高分辨率片上电源噪声测量的电路和技术
4. Measurement of on-chip I/O power supply noise and correlation verification between noise magnitude and delay increase due to SSO [C] . Takai Yasumichi, Ogasahara Yasuhiro, Hashimoto Masanori, Signal Propagation on Interconnects . 2010

机译：片上I / O电源噪声的测量以及噪声幅度与SSO引起的延迟增加之间的相关性验证
5. Measurement and regulation of on-chip power supply noise. [D] . Alon, Elad. 2007

机译：片上电源噪声的测量和调节。
6. Measurement with verification of stationary signals and noise in extremely quiet environments: Measuring below the noise floor [O] . Roger M. Ellingson, a), Frederick J. Gallun, -1

机译：在极端安静的环境中进行测量以验证固定信号和噪声：在本底噪声以下进行测量
7. Validation of a Full-Chip Simulation Model for Supply Noise and Delay Dependence on Average Voltage Drop With On-Chip Delay Measurement [O] . Yasuhiro Ogasahara, Student Member, Takashi Enami, 2010

机译：利用片上延迟测量验证电源噪声和延迟对平均电压降的依赖性的全芯片仿真模型

Measurement of On-chip I/O Power Supply Noise and Correlation Verification between Noise Magnitude and Delay Increase due to SSO

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